Electronic Manufacturing
Subject ELEN90045 (2012)
Note: This is an archived Handbook entry from 2012.
Credit Points: | 12.50 | ||||||||||||
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Level: | 9 (Graduate/Postgraduate) | ||||||||||||
Dates & Locations: | This subject has the following teaching availabilities in 2012: Semester 2, Parkville - Taught on campus.
Timetable can be viewed here. For information about these dates, click here. | ||||||||||||
Time Commitment: | Contact Hours: 1 two hour lecture per week Total Time Commitment: 120 hours | ||||||||||||
Prerequisites: | Prerequisites for this subject are Subject Study Period Commencement: Credit Points: | ||||||||||||
Corequisites: | None | ||||||||||||
Recommended Background Knowledge: | None | ||||||||||||
Non Allowed Subjects: | None | ||||||||||||
Core Participation Requirements: | For the purposes of considering request for Reasonable Adjustments under the Disability Standards for Education (Cwth 2005), and Students Experiencing Academic Disadvantage Policy, academic requirements for this subject are articulated in the Subject Description, Subject Objectives, Generic Skills and Assessment Requirements of this entry. The University is dedicated to provide support to those with special requirements. Further details on the disability support scheme can be found at the Disability Liaison Unit website: http://www.services.unimelb.edu.au/disability/ |
Subject Overview: | Packaging, Testing and ESD protection are critical components in the design of real chipsets and systems. This subject will enable students to design packaging and ESD systems. Students will also be introduced to international standards and mechanisms to establish the MTBF and reliability of systems. |
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Objectives: | Upon successful completion of this subject students should be able to:
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Assessment: |
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Prescribed Texts: | TBA |
Breadth Options: | This subject is not available as a breadth subject. |
Fees Information: | Subject EFTSL, Level, Discipline & Census Date |
Generic Skills: |
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Related Course(s): |
Master of Nanoelectronic Engineering |
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